Microstructure Contact Studies for Skutterudite Thermoelectric Devices
Source abstract
Abstract
The skutterudite/electrode thermoelectric joints were fabricated with the insertion of Ti foil by spark plasma sintering. The interfacial microstructure and reliability of joints were studied during thermal duration test. A multilayer structure, which was composed of intermetallic compounds, was observed at the CoSb 3 / Ti interface after thermal aging of 20 days. The interfacial reactions and diffusion path between CoSb 3 and Ti were discussed. The contact resistance of CoSb 3 /electrode junction was measured through four‐probe method and the thermal contact resistance was calculated based on multilayer mode measurement. Effects of the contact resistivity on the performance of CoSb 3 ‐based device were discussed.
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Research context
OpenAlex topics: Advanced Thermoelectric Materials and Devices · Electronic Packaging and Soldering Technologies · Thermal properties of materials
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
School of Materials Science and Engineering University of Jinan Jinan 250014 People's Republic of China
Energy Materials Research Center Shanghai Institute of Ceramics Chinese Academy of Sciences Shanghai 200050 People's Republic of China
References (19)
Show source-provided references
1. 10.1016/S0378-7753(02)00597-910.1016/S0378-7753(02)00597-9 ↗
2. 10.1063/1.218044910.1063/1.2180449 ↗
3. 10.1063/1.309980410.1063/1.3099804 ↗
4. 10.1016/j.actamat.2010.03.02510.1016/j.actamat.2010.03.025 ↗
5. 10.1016/j.actamat.2009.03.01810.1016/j.actamat.2009.03.018 ↗
6. 10.1016/j.matlet.2004.07.04110.1016/j.matlet.2004.07.041 ↗
7. 10.1016/j.jallcom.2008.10.03710.1016/j.jallcom.2008.10.037 ↗
8. 10.1016/j.enconman.2005.03.02310.1016/j.enconman.2005.03.023 ↗
9. 10.1016/j.enconman.2006.06.00810.1016/j.enconman.2006.06.008 ↗
10. 10.1016/S0196-8904(02)00109-710.1016/S0196-8904(02)00109-7 ↗
11. R. J.BuistandS. J.Roman “Development of a Burst Voltage Measurement System for High‐Resolution Contact Resistance Tests of Thermoelectric Heterojunctions ” Proceedings of the 18th International Conference on Thermoelectrics Baltimore MA August 29–September 2 1999.
12. 10.1016/S0196-8904(99)00102-810.1016/S0196-8904(99)00102-8 ↗
13. 10.1016/0378-7753(92)80114-Q10.1016/0378-7753(92)80114-Q ↗
14. 10.1016/S0196-8904(02)00062-610.1016/S0196-8904(02)00062-6 ↗
15. 10.1016/j.jallcom.2004.03.07610.1016/j.jallcom.2004.03.076 ↗
16. 10.1016/S0378-7753(97)02801-210.1016/S0378-7753(97)02801-2 ↗
17. Synthesis of YbyCo4Sb12/Yb2O3 Composites and Their Thermoelectric Properties
18. 10.1016/j.jallcom.2010.09.16210.1016/j.jallcom.2010.09.162 ↗
19. 10.1149/1.274933010.1149/1.2749330 ↗