DataVXApplied SciencesPaper
journal article·2019-07-19Open access

Vertical-Type Ni/GaN UV Photodetectors Fabricated on Free-Standing GaN Substrates

Bing Ren, Meiyong Liao, Masatomo Sumiya, Jian Huang, Linjun Wang, Yasuo Koide, Liwen Sang

Applied Sciences· Volume 9· Issue 14
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Source abstract

Abstract

The authors report on a vertical-type visible-blind ultraviolet (UV) Schottky-type photodetector fabricated on a homoepitaxial GaN layer grown on free-standing GaN substrates with a semi-transparent Ni Schottky contact. Owing to the high-quality GaN drift layer with low-density threading dislocation and high electron mobility, the UV photodetector shows a high specific detectivity of more than 1012 Jones and a UV/visible discrimination ratio of ~1530 at −5 V. The photodetector also shows the excellent self-powered photo-response and a high signal-to-noise ratio of more than 104 at zero voltage. It is found that a relatively lower growth rate for the GaN epilayer is preferred to improve the performance of the Schottky-type photodetectors due to the better microstructure and surface properties.
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Research context

OpenAlex topics: GaN-based semiconductor devices and materials · Ga2O3 and related materials · Nanowire Synthesis and Applications

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

School of Materials Science and Engineering, Shanghai University, Shanghai 200444, China

International Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan

Research Center for Functional Materials, National Institute for Materials Sciences, Namiki 1-1, Tsukuba, Ibaraki 305-0044, Japan

Amano-Koide Collaborative Research Lab, National Institute for Materials Science, (NIMS), 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan

Funding

National Natural Science Foundation of China · Science and Technology Commission of Shanghai · Japan Society for the Promotion of Science

References (21)

Show source-provided references
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