journal article·2025-07-07Open access

PCES-YOLO: High-Precision PCB Detection via Pre-Convolution Receptive Field Enhancement and Geometry-Perception Feature Fusion

Heqi Yang, Junming Dong, Cancan Wang, Zhida Lian, Hui Chang

Applied Sciences· Volume 15· Issue 13

Abstract

Printed circuit board (PCB) defect detection faces challenges like small target feature loss and severe background interference. To address these issues, this paper proposes PCES-YOLO, an enhanced YOLOv11-based model. First, a developed Pre-convolution Receptive Field Enhancement (PRFE) module replaces C3k in the C3k2 module. The ConvNeXtBlock with inverted bottleneck is introduced in the P4 layer, greatly improving small-target feature capture and semantic understanding. The second key innovation lies in the creation of the Efficient Feature Fusion and Aggregation Network (EFAN), which integrates a lightweight Spatial-Channel Decoupled Downsampling (SCDown) module and three innovative fusion pathways. This achieves substantial parameter reduction while effectively integrating shallow detail features with deep semantic features, preserving critical defect information across different feature levels. Finally, the Shape-IoU loss function is incorporated, focusing on bounding box shape and scale for more accurate regression and enhanced defect localization precision. Experiments on the enhanced Peking University PCB defect dataset show that PCES-YOLO achieves a mAP50 of 97.3% and a mAP50–95 of 77.2%. Compared to YOLOv11n, it shows improvements of 3.6% in mAP50 and 15.2% in mAP50–95. When compared to YOLOv11s, it increases mAP50 by 1.0% and mAP50–95 by 5.6% while also significantly reducing the model parameters. The performance of PCES-YOLO is also evaluated against mainstream object detection algorithms, including Faster R-CNN, SSD, YOLOv8n, etc. These results indicate that PCES-YOLO outperforms these algorithms in terms of detection accuracy and efficiency, making it a promising high-precision and efficient solution for PCB defect detection in industrial settings.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Industrial Vision Systems and Defect Detection · Advanced Neural Network Applications · Image and Object Detection Techniques

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

School of Electrical and Automation Engineering, Shandong University of Science and Technology, Qingdao 266590, China

School of Electronic Information Engineering, Shandong University of Science and Technology, Qingdao 266590, China

Funding

National Natural Science Foundation of China · Shandong Provincial Natural Science Foundation · Shandong Province Major Science and Technology Innovation Project · Science and Technology Support Plan for Youth Innovation of Colleges and Universities of Shandong Province of China

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