Echelle Grating Spectroscopic Technology for High-Resolution and Broadband Spectral Measurement
Source abstract
Abstract
Echelle grating provides high spectral resolving power and diffraction efficiency in a broadband wavelength range by the Littrow mode. The spectrometer with the cross-dispersed echelle scheme has seen remarkable growth in recent decades. Rather than the conventional approach with common blazed grating, the cross-dispersed echelle scheme achieves the two-dimensional spatial distribution of the spectrum by one exposure without scanning in the broadband spectral range. It is the fastest and most sensitive spectroscopic technology as of now, and it has been extensively applied in commercial and astronomical spectrometers. In this review, we first highlight the characteristics of the echelle and then present the optical layout, detection approach, and method of calibration. Finally, we discuss the state-of-the-art implementations and applications of commercial and astronomical instruments.
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Research context
OpenAlex topics: Spectroscopy and Laser Applications · Laser-induced spectroscopy and plasma · Calibration and Measurement Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Key Laboratory of Opto-Electronics Information Technology, Ministry of Education, Tianjin University, Tianjin 300072, China
Science and Technology on Electro-Optical Information Security Control Laboratory, Tianjin 300308, China
State Key Laboratory of Precision Measurement Technology and Instruments, Tsinghua University, Beijing 100084, China
Funding
National Key Scientific Instrument and Equipment Development Project of China · National Natural Science Foundation of China (NSFC) · Strategic Priority Research of the Chinese Academy of Sciences (CAS)
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