Modulation spectroscopy of solid solutions between II—VI compounds
Source abstract
Abstract
The electroreflectance spectra and microhardness of Hg0.8Cd0.2Te, Hg0.84Mn0.16Te, and Hg0.81Cd0.18Mn0.01Te crystals, whose surfaces were mechanically polished, chemically etched, and exposed to argon plasma, were studied. The thickness of the polishing damage layer was found to correlate with microhardness. The penetration depth of Ar+ ions in Hg0.81Cd0.18Mn0.01Te was determined
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Thermography and Photoacoustic Techniques · Optical and Acousto-Optic Technologies · Advanced Semiconductor Detectors and Materials
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References (3)
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2. Franz, W., Einflusseines electrischen Felden auf eine optiche Absorptionscante,Z. Naturforsch., 1958, vol. 13, no. 6, pp. 484–489.10.1515/zna-1958-0609 ↗
3. Aliev, I.M., Electroreflectance and Microhardness of Hg-Cd-Mn-Te Crystals,Fizika, 1996, vol. 2, no. 1, pp. 52–53.