journal article·2015-07

Determination of impurities in bismuth oxide by laser mass spectrometry

D. Yu. Troitsky, A. I. Saprykin

Inorganic Materials· Volume 51· Issue 7
Publisher page

Abstract

We have developed a technique for the quantitative analysis of bismuth oxide by laser mass spectrometry. The technique makes it possible to determine up to 70 impurities in the range 10 −6 to 10 −4 wt %. To evaluate relative sensitivity factors and obtain calibration plots, we used reference samples prepared by diluting a standard SOG-21-1 graphite sample with high-purity bismuth oxide powder.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: X-ray Diffraction in Crystallography · Advanced ceramic materials synthesis · Nuclear materials and radiation effects

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (12)

Show source-provided references
1. Nath, A.K. and Medhi, N., Piezoelectric properties of environmental friendly bismuth doped barium titanate ceramics, Mater. Lett., 2012, vol. 73, pp. 75–77.10.1016/j.matlet.2011.12.113 ↗
2. Watanabe, T., et al., Hardness and elastic properties of Bi2O3-based glasses, J. Mater. Sci., 2001, vol. 36, pp. 2427–2433.10.1023/A:1017973830342 ↗
3. Novoselov, I.I., Makarov, I.V., Fedotov, V.A., Ivannikova, N.V., and Shubin, Yu.V., Synthesis of a bismuth germanium oxide source material for Bi4Ge3O12 crystal growth, Inorg. Mater., 2013, vol. 49, no. 4, pp. 412–415.10.1134/S0020168513030138 ↗
4. Yukhin, Yu.M., Mikhailov, Yu.I., Afonina, L.I., and Podkopaev, O.I., Synthesis of high-purity bismuth oxide, Vysokochist. Veshchestva, 1996, no. 4, pp. 62–71.
5. Novoselov, I.I., Petrova, N.I., Troitskii, D.Yu., and Tkachev, D.S., Bismuth refining by vacuum distillation, Khim. Khim. Tekhnol., 2006, no. 8, pp. 40–44.
6. Shelpakova, I.R., Chanysheva, T.A., Tsygankova, A.R., Rodionov, S.G., Troitskii, D.Yu., Petrova, N.I., and Saprykin, A.I., Atomic-emission spectral analysis of bismuth oxide with impurity preconcentration by reactive vaporization of the host, Zavod. Lab. Diagn. Mater,, 2007, vol. 73, no. 8, pp. 15–20.
7. Shelpakova, I.R., Tsygankova, A.R., and Saprykin, A.I., Determination of impurities in bismuth and its compounds (review), Metody Obekty Khim. Anal., 2007, vol. 2, no. 2, pp. 117–129.
8. Tsygankova, A.R., Makashova, G.V., Shelpakova, I.R., and Saprykin, A.I., Analysis of bismuth oxide by inductively coupled plasma atomic emission spectroscopy, Zavod. Lab., Diagn. Mater., 2013, vol. 79, no. 3, pp. 12–16.
9. Chanysheva, T.A. and Shelpakova, I.R., Unified atomic emission analysis of various systems, Anal. Kontrol’, 2008, vol. 6, no. 3, pp. 298–306.
10. Sysoev, A.A., Mass spectrometric elemental analysis of solid substances in Russia, J. Anal. Chem., 2011, vol. 66, no. 11, pp. 1079–1089.10.1134/S106193481111013X ↗
11. Polyakova, E.V., Shuvaeva, O.V., and Saprykin, A.I., Chlorine impurity content of Bi2O3 and GeO2, Inorg. Mater., 2008, vol. 44, no. 9, pp. 986–989.10.1134/S0020168508090161 ↗
12. Sysoev, V.I., Troitskii, D.Yu., and Saprykin, A.I., Analysis of silicon carbonitride films by laser mass spectrometry, Mass-Spektrometriya, 2013, vol. 10, no. 2, pp. 103–108.