X-ray fluorescence analysis based on the modified standard-background procedure in the system of analytical control of solid-phase products of metallurgical precious metal products
Source abstract
Abstract
An original approach to the X-ray fuorescence analysis of metallutgical precious metal products, in terms of which an equation of a certain type determined from theoretical and semiempirical considerations was proposed instead of multiple regression equations, was described. This allows reducing the number of calibrating reference samples, considerably simplifying the calibrating procedure and reducing the cost of analysis. The developed method of analytical control was successfully applied for the product analysis of the metallurgical shop of the Copper Plant, West Affiliate, JSC MMC Norilsk Nickel.
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Research context
OpenAlex topics: Advanced X-ray and CT Imaging
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References (12)
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