journal article·2023-01-18Open access

A New Method to Detect Splicing Image Forgery Using Convolutional Neural Network

Khalid M. Hosny, Akram M. Mortda, Nabil A. Lashin, Mostafa M. Fouda

Applied Sciences· Volume 13· Issue 3

Abstract

Recently, digital images have been considered the primary key for many applications, such as forensics, medical diagnosis, and social networks. Image forgery detection is considered one of the most complex digital image applications. More profoundly, image splicing was investigated as one of the common types of image forgery. As a result, we proposed a convolutional neural network (CNN) model for detecting splicing forged images in real-time and with high accuracy, with a small number of parameters as compared with the recently published approaches. The presented model is a lightweight model with only four convolutional layers and four max-pooling layers, which is suitable for most environments that have limitations in their resources. A detailed comparison was conducted between the proposed model and the other investigated models. The sensitivity and specificity of the proposed model over CASIA 1.0, CASIA 2.0, and CUISDE datasets are determined. The proposed model achieved an accuracy of 99.1% in detecting forgery on the CASIA 1.0 dataset, 99.3% in detecting forgery on the CASIA 2.0 dataset, and 100% in detecting forgery on the CUISDE dataset. The proposed model achieved high accuracy, with a small number of parameters. Therefore, specialists can use the proposed approach as an automated tool for real-time forged image detection.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Digital Media Forensic Detection · Cell Image Analysis Techniques · Generative Adversarial Networks and Image Synthesis

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Department of Information Technology, Zagazig University, Zagazig 44519, Egypt

Department of Information Technology, Faculty of Information Technology and Computer Science, Sinai University, Arish 16020, Egypt

Department of Electrical and Computer Engineering, Idaho State University, Pocatello, ID 83209, USA

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