DataVXApplied Physics APaper
journal article·2025-05

Multiple non-linear regression for microwaves characterization of dielectric materials

Hakim Sadou, Tarik Hacib, Yann Le Bihan, Olivier Meyer, Hulusi Acikgoz

Applied Physics A· Volume 131· Issue 5
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OpenAlex topics: Microwave and Dielectric Measurement Techniques · Microwave Imaging and Scattering Analysis · Soil Moisture and Remote Sensing

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References (22)

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