journal article·1995-07-01

A slow positron lifetime study of the annealing behaviour of an amorphous silicon layer grown by MBE

J. St�rmer, P. Willutzki, D. T. Britton, G. K�gel, W. Triftsh�user, W. Kiunke, F. Wittmann, I. Eisele

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Research context

OpenAlex topics: Muon and positron interactions and applications · Glass properties and applications · 3D IC and TSV technologies

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