journal article·1995-11-01

Electronic properties of silicon-nitride films deposited by low-energy ion-beam bombardment

Zhong-Min Ren, Fang Lu, Yuan-Cheng Du, Zhi-Feng Ying, Fu-Ming Li

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Abstract

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Research context

OpenAlex topics: Semiconductor materials and devices · Ion-surface interactions and analysis · Metal and Thin Film Mechanics

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