journal article·1995-05-01

In-situ monitoring of interface formation using the phase shift of reflection high-energy electron diffraction intensity oscillations

W. Braun, K. Ploog

Publisher page

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Source: Not provided · Quality: missing

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · nanoparticles nucleation surface interactions

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References

Reference metadata was not supplied for this record.