Statistical analysis of a round-robin measurement survey of two candidate materials for a Seebeck coefficient Standard Reference Material | NIST

John Y. Lu; Nathan D. Lowhorn; Winnie K. Wong‐Ng; Weiping Zhang; Evan L. Thomas; M. Otani; Martin L. Green; Thanh‐Nhan Tran; Chris Caylor; N. R. Dilley; Adams Downey; B. Edwards; Norbert Elsner; Saeid Ghamaty; Timothy P. Hogan; Qing Jie; Qiang Li; Joshua Martin; George S. Nolas; H. Obara; Jeffrey Sharp; R. Venkatasubramanian; R. Willigan; Jihui Yang; Terry M. Tritt

article·2009-02-02

Statistical analysis of a round-robin measurement survey of two candidate materials for a Seebeck coefficient Standard Reference Material | NIST

John Y. Lu, Nathan D. Lowhorn, Winnie K. Wong‐Ng, Weiping Zhang, Evan L. Thomas, M. Otani, Martin L. Green, Thanh‐Nhan Tran, Chris Caylor, N. R. Dilley, Adams Downey, B. Edwards, Norbert Elsner, Saeid Ghamaty, Timothy P. Hogan, Qing Jie, Qiang Li, Joshua Martin, George S. Nolas, H. Obara, Jeffrey Sharp, R. Venkatasubramanian, R. Willigan, Jihui Yang, Terry M. Tritt

Applied Physics A

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OpenAlex topics: Scientific Measurement and Uncertainty Evaluation · Advanced Sensor Technologies Research

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