journal article·1998-03

The effect of germane variation on microstructure in polycrystalline Si/Si1-xGex thin films grown by rapid thermal chemical vapour deposition: fractal characterisation using scanning probe microscopy

P.A. Campbell, D.G. Walmsley, R.L.F. Chong, D. Gay, H.S. Gamble, D.W. McNeill

Applied Physics A· Volume 66· Issue S1
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Research context

OpenAlex topics: Adhesion, Friction, and Surface Interactions · Surface Roughness and Optical Measurements · Force Microscopy Techniques and Applications

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