Auger electron spectroscopy study on the Cr/Al2O3 interfacial reactions
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques · Semiconductor materials and devices
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (9)
Show source-provided references
1. H. Lu, C.L. Bao, D.H. Shen, X.J. Zhang, Y.D. Cui, Z.D. Lin: J. Mater. Sci.30 339 (1995)10.1007/BF00354393 ↗
2. M.P. Seah, W.A. Dench: Surf. Interface Anal.1 (1979) 210.1002/sia.740010103 ↗
3. J.J. Mcclelland, J. Unguris, R.E. Scholten, D.T. Pierce: J. Vac. Sci. Technol.A11, 2863 (1993)10.1116/1.578657 ↗
4. J.W. Park, A.J. Pedraza, W.R. Allen: Mat. Res. Soc. Symp. Proc. Vol. 357, 1995 Materials Research Society, p. 59
5. K. Ishiguro, T. Homma: J. Japan Inst. Metals45, 360 (1981)10.2320/jinstmet1952.45.4_360 ↗
6. Y. Sakisaka, H. Kato, M. Onchi: Surf. Sci.120, 150 (1982)10.1016/0039-6028(82)90279-5 ↗
7. Y. Abe, A. Kato, T. Nakamura: Surf. Interface Analys.22, 14 (1994)10.1002/sia.740220106 ↗
8. S. Ekelund, C. Leygraf: Surf. Sci.40, 179 (1973)10.1016/0039-6028(73)90061-7 ↗
9. H. Lu, C.L. Bao, D.H. Shen, J. Qin, Y.D. Cui, Y.X. Wang: J. Phys. Chem. Solids (submitted)