Microstructure and magnetic properties of Co(Cr)/Ti(Cr)/ZnO films prepared by laser ablation on Si substrates

High-quality Co(Cr)(50–66 nm)/Ti(Cr)(25–30 nm)/ZnO(165–225 nm) films were grown on Si substrates by the pulsed-laser deposition technique at 450–500°C. The microstructure of the films and their magnetic properties were investigated by X-ray diffraction, transmission electron microscopy and a vibrating sample magnetometer. It was found that the Co(Cr)/Ti(Cr)/ZnO thin films had a highly preferential c-axis direction normal to the surface of the substrate, and the ZnO sublayer had columnar structures in the growth direction. The interface of the multi-layer films is smooth without interface reaction. The as-produced films had in-plane easy magnetization. It indicates that the enhancements of the magnetic properties of the films are mainly ascribed to the grain structure and multi-domain state of the Co-alloy layer, which can be controlled by the ZnO sublayer.