journal article·1987-04

XRF induced by PIXE: Comparison with radioisotope XRF

K. A. Al-Saleh, J. D. Meyer, N. S. Saleh

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: X-ray Spectroscopy and Fluorescence Analysis · Electron and X-Ray Spectroscopy Techniques · Ion-surface interactions and analysis

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References (8)

Show source-provided references
1. R. Jenkins: InX-Ray Spectrometry, ed., by H.K. Herglotz and L.S. Birks (Dekker, New York 1978) Chap. 10
2. J.I. Goldstein, H. Yakovitz (eds.):Practically Scanning Electron Microscopy, 3rd edn. (Plenum, New York 1977)
3. K.R. Akselsson, S.A.E. Johansson: IEEE Trans. NS-26, 1358 (1979)
4. J.V. Gilfrich, E.F. Skelton, S.B. Quadri, J.P. Kirkland, D.J. Nagel: Anal. Chem.55, 187 (1983)10.1021/ac00253a006 ↗
5. A.B. Hallak, N.S. Saleh: Dirasat9, 39 (1982)
6. N.S. Saleh, A.B. Hallak: Arabian J. Science Eng.7, 225 (1982)
7. A.B. Hallak, N.S. Saleh: X-Ray Spect.12, 148 (1983)10.1002/xrs.1300120405 ↗
8. R. Jenkins:An Introduction to X-Ray Spectrometry (Heydon, London 1974) p. 111