journal article·1992-06

Formation of Ohmic contacts to n-GaAs using ion beam mixing of Tellurium

K. Prasad

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OpenAlex topics: Semiconductor materials and interfaces · Integrated Circuits and Semiconductor Failure Analysis · Semiconductor materials and devices

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References (11)

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1. A. Piotrowska, A. Guivarch, G. Pelous: Solid State Electron. 26, 179 (1983)10.1016/0038-1101(83)90083-7 ↗
2. S.S. Gill, J.R. Dawsey: Thin Solid Films 167, 161 (1988)10.1016/0040-6090(88)90492-0 ↗
3. K. Prasad, L. Faraone, A.G. Nassibian: Semicond. Sci. Technol. 4, 458 (1989)10.1088/0268-1242/4/6/006 ↗
4. G. Eckhardt: In Laser and Electron Beam Processing of Materials, ed. by C.W. White, P.S. Peercy (Academic, New York 1980) p. 46710.1016/B978-0-12-746850-1.50070-0 ↗
5. K. Prasad, L. Faraone, A.G. Nassibian: Semicond. Sci. Technol. 4, 657 (1989)10.1088/0268-1242/4/8/009 ↗
6. J. Wurfl, A.G. Nassibian, H.L. Hartnagel, R. Langfeld, C. Maurer: Int. J. Electron. 66, 213 (1989)10.1080/00207218908925378 ↗
7. M. Kolawa, W. Flick, C.W. Nieh, J.M. Molarius, M.A. Nicolet, J.L. Tandon, J.H. Madok, F.C.T. So: IEEE Trans. ED-36, 1223 (1989)10.1109/16.24375 ↗
8. E.D. Marshall, W.X. Chen, C.S. Wu, S.S. Lau: Appl. Phys. Lett. 47, 298 (1985)10.1063/1.96198 ↗
9. J. Zhao, D.A. Thomson: J. Electron. Materials 17, 249 (1988)10.1007/BF02652187 ↗
10. C. Cozzolino, S.T. Johnson, J.S. Williams: Proc. 5th Australian Conference on Nuclear Techniques of Analysis (Lucas Heights, Sydney, Australia 1987) p. 89
11. G.K. Reeves: Solid State Electron. 23, 487 (1980)10.1016/0038-1101(80)90086-6 ↗