journal article·1985-08

C-V Technique on Schottky contacts — Limitation of implanted profiles

J. Voves, V. Rybka, V. Třeštíková

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Semiconductor materials and interfaces · Force Microscopy Techniques and Applications · Electrical Contact Performance and Analysis

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References (11)

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