The abnormal direct-current resistivity of Ni–Mn–Ni triple-layered magnetic thin-films and their magnetic wall observations
Source abstract
Abstract
We have observed an abnormal electron transport characteristic from the Ni–Mn–Ni triple-layered magnetic thin-films. Due to the intercalated Mn ultra-thin interlayer, the magnetic domain structure and the electron transport characteristic differ a lot from their original magnetic (Fe, Co, and Ni) films. As inspected by a magnetic force microscopy (MFM), we observed the variation of the domain configuration with Mn interlayer thicknesses (for 1, 5, and 10 nm). Moreover, we also examined and found that the direct current (DC) resistivity have no significant change as the current conducts from the current-in-wall (CIW) to the current- perpendicular-to-wall (CPW), which are opposite to the results of single layered films.
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Research context
OpenAlex topics: Magnetic properties of thin films · Magnetic Field Sensors Techniques · Advanced Memory and Neural Computing
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References (17)
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