journal article·1991-09

Structural and optical studies of the discontinuous behaviour of Te thin films subjected to He implantation

J. Beauvais, R. A. Lessard, P. Galarneau, E. J. Knystautas

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Research context

OpenAlex topics: Chalcogenide Semiconductor Thin Films · Phase-change materials and chalcogenides · Advanced Semiconductor Detectors and Materials

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References (17)

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