The determination of dislocation density depth profiles in surface layers from broadening of X-ray diffraction profiles
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Research context
OpenAlex topics: X-ray Diffraction in Crystallography · Microstructure and mechanical properties · Metal and Thin Film Mechanics
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References (7)
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5. G.K. Williamson, R.E. Smallman: Philos. Mag. 1, 34 (1956)10.1080/14786435608238074 ↗
6. M. Wilkens: Physica Status Solidi A 2, 359 (1970)10.1002/pssa.19700020224 ↗
7. T. Ungar, H. Mughrabi, M. Wilkens: Acta Metall. 34, 1257 (1986)10.1016/0001-6160(86)90012-X ↗