Topography and friction properties of macromolecular thin films using atomic-force-microscopy technology

Y.W. Chen; D.J. Gan; S. Kreiling; C.S. Song; S.Q. Lu; Z.J. Wang

doi:10.1007/s00339-002-1504-7

journal article·2003-01-01

Topography and friction properties of macromolecular thin films using atomic-force-microscopy technology

Y.W. Chen, D.J. Gan, S. Kreiling, C.S. Song, S.Q. Lu, Z.J. Wang

Applied Physics A: Materials Science & Processing· Volume 76· Issue 1

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Source abstract

Abstract

The research work in this letter is on the microtribological properties of poly(ether ketone ketone) (PEKK) and sulfonated PEKK (S-PEKK) thin films. Polystyrene (PS) was used as a reference for the investigation. Atomic-force-microscopy (AFM) techniques were used for observing the topography and friction properties of the macromolecular thin films at the nanometer scale. The polymeric thin films were fabricated by spin coating at a speed of 4000 rotations per minute (rpm).

Source: openaire · Quality: candidate unverified · Source record ↗

Research context

Polymers Nanomaterials

OpenAlex topics: Tribology and Wear Analysis · Force Microscopy Techniques and Applications · Lubricants and Their Additives

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