Possibility of Transport Through a Single Acceptor in a Gate-All-Around Silicon Nanowire PMOSFET
Source abstract
Abstract
Temperature-dependent electrical transport measurements of cylindrical shaped gate-all-around silicon nanowire p-channel MOSFET were performed. At 4.2 K, they show current oscillations, which can be analyzed by single hole tunneling originated from nanowire quantum dots. In addition to this single hole tunneling, one device exhibited strong current peaks, surviving even at room temperature. The separations between these current peaks corresponded to the energy of 25 and 26 meV. These values were consistent with the sum of the bound-state energy spacing and the charging energy of a single boron atom. The radius calculated from the obtained single-atom charging energy was also comparable to the light-hole Bohr radius.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Semiconductor materials and devices · Advancements in Semiconductor Devices and Circuit Design · Nanowire Synthesis and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (15)
Show source-provided references
1. 10.1109/IEDM.2005.160945310.1109/IEDM.2005.1609453 ↗
2. MOSFETs fabricated by top-down CMOS process
3. 10.1063/1.273449010.1063/1.2734490 ↗
4. 10.1109/LED.2007.90986810.1109/LED.2007.909868 ↗
5. 10.1103/PhysRevB.14.241710.1103/PhysRevB.14.2417 ↗
6. Room-temperature ultraviolet nanowire nanolasers10.1126/science.1060367 ↗
7. 10.1016/S0038-1101(01)00034-X10.1016/S0038-1101(01)00034-X ↗
8. 10.1063/1.282457910.1063/1.2824579 ↗
9. 10.1038/nphys99410.1038/nphys994 ↗
10. Transport sepctroscopy of a single dopant in a gated silicon nanowire10.1103/PhysRevLett.97.206805 ↗
11. Observation of the linear stark effect in a single acceptor in Si10.1103/PhysRevLett.98.096805 ↗
12. 10.1063/1.267925410.1063/1.2679254 ↗
13. 10.1103/PhysRevB.76.03531910.1103/PhysRevB.76.035319 ↗
14. 10.1109/IEDM.1993.34721510.1109/IEDM.1993.347215 ↗
15. 10.1109/VLSIT.2004.134547610.1109/VLSIT.2004.1345476 ↗