journal article·1996-01

Spatial distributions of boron in silicon obtained by combination of two-dimensional bevelling and autoradiography

D. Fink, S. Koul, H. Kranz

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OpenAlex topics: Ion-surface interactions and analysis · Silicon and Solar Cell Technologies · Integrated Circuits and Semiconductor Failure Analysis

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References (13)

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1. A. La Ferla, A.Di. Franco, E. Rimini, G. Ciavolo, G. Ferla: Mater. Sci. Eng. B2, 69 (1989)10.1016/0921-5107(89)90078-0 ↗
2. D. Fink, M. Müller, L.T. Chadderton, P.H. Cannington, R.G. Elliman, D.C. McDonald: Nucl. Instrum. Methods B32, 125 (1988)10.1016/0168-583X(88)90194-2 ↗
3. H. Okushi, Y. Tokumaru, H. Naka:Proc. of the 5th Int'l Conf. on Defect Recognition and Image Processing in Semiconductors and Devices, J. Jimenze ed. by (IOP, Bristol 1994) p. 25
4. Z.G. Wang, C.J. Li, S.K. Wan, L.Y. Lin: J. Cryst. Growth103, 38 (1990)10.1016/0022-0248(90)90167-J ↗
5. V. Privitera, V. Raineri, E. Rimini: J. Appl. Phys.74, 2370 (1993)10.1063/1.354723 ↗
6. B.L. Sopori, R. Murphy. C. Marshall:23rd IEEE Photovoltaic Specialists Conference IEEE 1993) p. 190
7. K. L. Wang: Appl. Phys. Lett.29, 700 (1976)10.1063/1.88931 ↗
8. Y. Sugawara, S. Moritat, Y. Fukano, T. Uchihashi, T. Okusako, A. Chayahara, Y. Yamanishi, T. Oasa: Jpn. J. Appl. Phys.33, L74 (1994)10.1143/JJAP.33.L74 ↗
9. H. Baumbach, K. Freyer, D. Bautzmann, H. Koch: Nukleonika21, 199 (1976)
10. J.P. Biersack, L.G. Haggmark: Nucl. Instrum. Methods174, 257 (1980)10.1016/0029-554X(80)90440-1 ↗
11. J. Lorenz, R. J. Wierzbicki, H. Ryssel: Nucl. Instrum. Methods B96, 168 (1995)10.1016/0168-583X(94)00478-1 ↗
12. M. Müller, D. Fink: Nucl. Instrum. Methods B34, 162 (1988)10.1016/0168-583X(88)90738-0 ↗
13. L.T. Chadderton, J.L. Zhu, S.A. Cruz, D. Fink, S. Gosh: Nucl. Instrum. Methods B91, 168 (1994)10.1016/0168-583X(94)96209-X ↗