journal article·2002-12-01

A new method of Debye-Scherrer pattern integration on two-dimensional detectors, demonstrated for the new structure powder diffractometer (SPODI) at the FRM-II in Garching

F. Elf, R. Gilles, G.R.J. Artus, S. Roth

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Abstract

The expected diffraction patterns of the new powder diffractometer SPODI, currently under construction at the FRM-II in Garching, will be smeared Debye–Scherrer rings as depicted by Monte Carlo (MC) simulations. To overcome this disadvantage, a concept based on the combination of MC simulations and empirical approximation methods is developed to reverse the smearing by deconvolution and then summing up along the rings, including corrections for different arc lengths, resulting in conventional one-dimensional diffraction patterns suitable for Rietveld-refinement programs without further processing.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: X-ray Diffraction in Crystallography · Solid-state spectroscopy and crystallography

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