journal article·1990-02

Electronic transport properties of double layer metallic films

G. Bordin, F. Gallerani, A. Magnaterra

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Copper Interconnects and Reliability · Magnetic properties of thin films · Electrodeposition and Electroless Coatings

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References (10)

Show source-provided references
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10. F.W. Reynolds, G.R. Stilwell: Phys. Rev. 88, 418 (1952)10.1103/PhysRev.88.418.2 ↗