Implanted-fluorine depth profiles in silver gallium diselenide
Source abstract
Abstract
Range distributions for fluorine ions in 19F+-implanted silver gallium diselenide (AgGaSe2) in an energy range of 80–350 keV were measured by using the 19F(p, αγ)16O resonant nuclear reaction at ER=872.1 keV with width Γ=4.2 keV. A proper convolution calculation method was used to extract the true distributions of fluorine from the experimental excitation-yield curves. The experimental range-distribution parameters, Rp and ΔRp, were compared with those obtained from Monte Carlo simulation codes.
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Research context
OpenAlex topics: X-ray Spectroscopy and Fluorescence Analysis · Advanced Semiconductor Detectors and Materials · Nuclear Physics and Applications
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