Discontinuous behaviour in the optical recording properties of he implanted te thin films
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OpenAlex topics: Semiconductor Lasers and Optical Devices · Phase-change materials and chalcogenides · Surface Roughness and Optical Measurements
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References (7)
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2. J. Beauvais, P. Galarneau, R.A. Lessard, E.J. Knystautas: Conference on Lasers and Electro-Optics, 1989, Baltimore, Maryland, Opt. Soc. Am. Tech. Dig. Ser. Vol. 11, TUJ37
3. R.W. Dutton, R.S. Muller: Thin Solid Films 11, 229?236 (1972)10.1016/0040-6090(72)90048-X ↗
4. Z. Marinkovic, R. Roy: Thin Solid Films 24, 355?359 (1974)10.1016/0040-6090(74)90180-1 ↗
5. M. Janda, A. Kubovy: Phys. Status Solidi 36, 391?402 (1976)10.1002/pssa.2210350143 ↗
6. H. Ryssel: In Ion Implantation Techniques, ed. by H. Ryssel, H. Glawischnig (Springer, Berlin, Heidelberg 1982) p. 17710.1007/978-3-642-68779-2_7 ↗
7. The calculations were performed with the TRIM-89 software, written by J.F. Ziegler, G. Cuomo, J.P. Biersack, and freely distributed by the authors