A novel method for determining the optical constantn λ of metallic films
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Optical Coatings and Gratings · Photonic and Optical Devices · Surface Roughness and Optical Measurements
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (11)
Show source-provided references
1. O.S.Heavens:Optical Properties of Thin Solid Films (Dover, New York 1965) p. 51
2. O.S.Heavens: InPhysics of Thin Films, Vol. 2, ed. by G.Hass and R.E.Thun (Academic Press, New York 1964) p. 209
3. F.Abelés: IbidPhysics of Thin Films, Vol. 6 ed. by G.Hass and R.E.Thun Academic Press, New York (1971) p. 182
4. M.Born, E.Wolf:Principles of Optics (Pergamon Press, London 1975) p. 51
5. N.Barakat, F.Abu Zakhm: Solid State Science Conference, Cairo, E.A.R. (1967)
6. S.Tolansky:Multiple Beam Interferometry of Surfaces and Films, O.U.P. London (1955)
7. H.V.Wartenberg: Verh. Dtsch. Phys. Ges.12, 105 (1910)
8. J.T.Littleton: Phys. Rev.33, 453 (1911)
9. F.B.Johnson, R.W.Christy: Phys. Rev. B9, 5056 (1974)10.1103/PhysRevB.9.5056 ↗
10. R.Atkinson, P.H.Lissberger: Thin Solid Films17, 207 (1973)10.1016/0040-6090(73)90129-6 ↗
11. R.L.Agard: J. Opt. Soc. Am.64, 1456 (1974)10.1364/JOSA.64.001456 ↗