journal article·1993-11

In0.2Ga0.8As/GaAs interface revealed by an AlAs marker layer

R. W. Glaisher, D. J. H. Cockayne, B. F. Usher

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OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Surface and Thin Film Phenomena · Advanced Electron Microscopy Techniques and Applications

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References (12)

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1. F.C. Frank, J.H. van der Merwe: Proc. R. Soc. A198, 216 (1949)10.1098/rspa.1949.0096 ↗
2. C.J. D. Hetherington, J.C. Barry, J.M. Bi, C.J. Humphreys, J. Grange, C. Wood: Mater. Res. Soc. Symp. 37, 41 (1985)
3. A.F. de Jong, D. Van Dyck: Ultramicroscopy 33, 269 (1990)10.1016/0304-3991(90)90044-M ↗
4. A. Ourmazd, F.H. Baumann, M. Bode, Y. Kim: Ultramicroscopy 34, 237 (1990)10.1016/0304-3991(90)90018-H ↗
5. J. Zou, B.F. Usher, D.J.H. Cockayne, R.W. Glaisher: J. Electron. Mater. 20, 855 (1991)10.1007/BF02665974 ↗
6. P.B. Hirsch: In Defects in Semiconductors, ed. by J. Narayan, T.Y. Tan (North-Holland, New York 1981) p. 257
7. J.C. Bravman, R. Sinclair: J. Electron. Microsc. Technol. 1, 53 (1984)10.1002/jemt.1060010106 ↗
8. P.A. Stadelmann: Ultramicroscopy 21, 131 (1987)10.1016/0304-3991(87)90080-5 ↗
9. R.W. Glaisher, A.E.C. Spargo, D.J. Smith: Ultramicroscopy 27, 131 (1989)10.1016/0304-3991(89)90082-X ↗
10. C.B. Boothroyd, W.B. Stobbs: Ultramicroscopy 31, 259 (1989)10.1016/0304-3991(89)90049-1 ↗
11. R. Kilaas, R. Gronsky: Ultramicroscopy 16, 193 (1985)10.1016/0304-3991(85)90073-7 ↗
12. J. Zou, D.J.H. Cockayne: Appl. Phys. Lett. 63 (in press)