Electron traps and positive DLTS signals in VPE GaAs MESFETs
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Semiconductor materials and devices · Semiconductor materials and interfaces · Electron and X-Ray Spectroscopy Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (13)
Show source-provided references
1. M.G. Alderstein: Electron. Lett.12, 297 (1976)10.1049/el:19760229 ↗
2. A. Zylberstejn, G. Bert, G. Nuzillat: Inst. Phys. Conf. Ser.45, 315 (1978)
3. T. Itoh, H. Yanai: IEEE Trans. Electron. Dev. ED-27, 1037 (1980)10.1109/T-ED.1980.19984 ↗
4. A. Mitonneau, D. Meignant, P. Baudet, M. Bert, L. Hollan: Inst. Phys. Conf. Ser.56, 445 (1981)
5. R.H. Wallis, A. Faucher, D. Pons, P.R. Jay: Inst. Phys. Conf. Ser.74, 287 (1985)
6. S.R. Blight, R.H. Wallis, H. Thomas: IEEE Trans. Electron. Dev. ED-33, 1447 (1986)10.1109/T-ED.1986.22693 ↗
7. J.P. Harrang, A. Tardella, M. Rosso, P. Alnot, J.F. Peray: J. Appl. Phys.61, 1931 (1987)10.1063/1.338040 ↗
8. J.D. Hawkins, A.R. Peaker: Appl. Phys. Lett.48, 227 (1986)10.1063/1.96565 ↗
9. G.M. Martin, S. Makram-Ebeid: Physica116B, 371 (1983)
10. A. Broniatowsky, A. Blosse, P.C. Srivastava, J.C. Bourgoin: J. Appl. Phys.54, 2907 (1983)10.1063/1.332492 ↗
11. M. Ozaki, K. Kodama, A. Shibatomi: Inst. Phys. Conf. Ser.63, 323 (1982)
12. J. Madden, M.R. Brozel, A.R. Peaker, A. Ashcroft: 17th European Solid State Device Research Conf. (ESSDERC) Proc., 885 (1987)
13. C. Ghezzi, E. Gombia, R. Mosca, M. Pillan: 17th European Solid State Device Research Conf. (ESSDERC) Proc., 859 (1987)