journal article·1974-01

Influence of X-irradiation on the solicon-silicon dioxide interface of MOS structures

G. Voland, H. Pagnia

Applied physics· Volume 3· Issue 1
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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Semiconductor materials and devices · Semiconductor materials and interfaces · Silicon Nanostructures and Photoluminescence

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References (16)

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