journal article·1984-04

Energy levels of paired donor impurities in SixGe1?x alloys

S. -F. Ren, K. E. Newman, J. D. Dow, O. F. Sankey

Publisher page

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Source: Not provided · Quality: missing

Research context

OpenAlex topics: Semiconductor materials and interfaces · Silicon and Solar Cell Technologies · Silicon Nanostructures and Photoluminescence

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (21)

Show source-provided references
1. O.F. Sankey, J.D. Dow: Appl. Phys. Lett.38, 685 (1981)10.1063/1.92479 ↗
2. O.F. Sankey, J.D. Dow: J. Appl. Phys.52, 5139 (1981)10.1063/1.329413 ↗
3. O.F. Sankey, H.P. Hjalmarson, J.D. Dow: Phys. Rev. Lett.45, 1656 (1980)10.1103/PhysRevLett.45.1656 ↗
4. O.F. Sankey, J.D. Dow: Phys. Rev. B26, 3243 (1982) and references to experimental work therein10.1103/PhysRevB.26.3243 ↗
5. M. Lannoo, P. Lenglart: J. Phys. Chem. Solids30, 2409 (1969)10.1016/0022-3697(69)90065-1 ↗
6. M. Lannoo, J. Bourgoin:Point Defects in Semiconductors I, Springer Sci. Solid-State Sci.22 (Springer, Berlin, Heidelberg, New York 1981)
7. W.Y Hsu, J.D. Dow, D.J. Wolford, B.G. Streetman: Phys. Rev. B16, 1597 (1977)10.1103/PhysRevB.16.1597 ↗
8. P. Vogl, H.P. Hjalmarson, J.D. Dow: Phys. Chem. Solids44, 353 (1983)10.1016/0022-3697(83)90064-1 ↗
9. H.P. Hjalmarson, P. Vogl, D.J. Wolford, J.D. Dow: Phys. Rev. Lett.44, 810 (1980) and to be published10.1103/PhysRevLett.44.810 ↗
10. C.M. Bhandari, D.M. Rowe: Contemp. Phys.21, 219 (1980)10.1080/00107518008210957 ↗
11. R. Braunstein, A.R. Moore, F. Herman: Phys. Rev.109, 695 (1958)10.1103/PhysRev.109.695 ↗
12. J. Tauc, H. Abraham: J. Phys. Chem. Solids20, 190 (1961)10.1016/0022-3697(61)90004-X ↗
13. J. Klein, F. Pollak, M. Cardona: Helv. Phys. Acta41, 968 (1968)
14. K.E. Newman, J.D. Dow: Bull. Am. Phys. Soc.27, 317 (1982) and unpublished
15. B. Bunker, S. Hulbert, J. Stott, F.C. Brown: Bull. Am. Phys. Soc.28, 412 (1983)
16. The binding energy of the Si2p core exciton is related to the energy level of the P deep trap. See H.P. Hjalmarson, H. Büttner, J.D. Dow: Phys. Rev. B24, 6010 (1981)10.1103/PhysRevB.24.6010 ↗
17. W.A. Harrison:Electronic Structure and the Properties of Solids (Freeman, San Francisco 1980)
18. I.V. Karpova, S.G. Kalashnikov: Intern. Conf. Phys. Semicond., Exeter (1962) p. 880
19. R. Conradt, J. Aengenheister: Solid State Commun.10, 321 (1972)10.1016/0038-1098(72)90016-6 ↗
20. J.D. Beck, R. Conradt: Solid State Commun.13, 93 (1973)10.1016/0038-1098(73)90075-6 ↗
21. A. Haug, W. Schmid: Solid-State Electron.25, 665 (1982) and references therein10.1016/0038-1101(82)90069-7 ↗