DataVXApplied Physics A: Materials Science & ProcessingPaper
journal article·1998-03-01

STM measurements of barrier height on Si(111)-7×7 and GaAs(110) cleaved surfaces using I(z), z(V) and I(z(V),V) techniques

B. Grandidier, J.P. Nys, D. Stievenard, X. de la Bro&ıuml;se, C. Delerue, M. Lannoo

Applied Physics A: Materials Science & Processing· Volume 66· Issue 7
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OpenAlex topics: Semiconductor materials and interfaces · Electron and X-Ray Spectroscopy Techniques

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