Optical properties of a 5 m echelle vacuum spectrometer with an approximately diffraction-limited resolving power in the order of 106
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OpenAlex topics: Calibration and Measurement Techniques · Advanced Measurement and Metrology Techniques · Advanced Sensor Technologies Research
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References (17)
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4. The spectrometer has been additionally used for hyperfine structure measurements by a group from the Technische Universität Berlin in the short wavelength range, where conventional Fabry-Pérot spectrometers are no longer applicable
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13. The master (33) was ruled on the interferometrically controlled MIT-B engine (in 1969) at the Massachusetts Institute of Technology, Cambridge, Mass.; see also G.H. Harrison, E.G. Loewen, R.S. Wiley: Appl. Opt.15, 971 (1976)10.1364/AO.15.000971 ↗
14. In this study, the image distribution generated by the optical system of the spectrometer (grating replaced by a plane mirror) is defined as the normalized irradianceE(y)/E(0) within the exit slit along the coordinatey. The image width is the 40%-width Δy 0.4 of the image distribution. However, due to the different usage in [11], the ray tracing width is introduced as the 50%-width Δy 0.5 of the image distribution. If the plane mirror is replaced by the echelle grating, the image distribution becomes the instrumental function
15. P.H. van Cittert: Z. Phys.65, 547 (1930)10.1007/BF01397051 ↗
16. R. Balhorn, H. Kunzmann, F. Lebowsky: Appl. Opt.11, 742 (1972)10.1364/AO.11.000742 ↗
17. According to the Rayleigh criterion, the resolving powerR of a spectrometer is approximately given byR≈λ/Δλ0.4. Δλ0.4 represents the 40%-width of the instrumental function experssed in wavelength units.R=nk is identical toR≈λ/Δλ0.4 in spectrometers with diffraction-limited resolving power