Contact versus bulk noise in resistive layers
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Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Electrical and Bioimpedance Tomography · Surface and Thin Film Phenomena
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References (7)
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1. W. Van Bokhoven: Arch. Elektr. �bertragungstech.32, 349?352 (1978)
2. L. Vandamme, W. Van Bokhoven: Appl. Phys.14, 205?215 (1977)10.1007/BF00883091 ↗
3. S. Demolder, A. Van Calster, M. Vandendriessche: Current noise in thick and thin film resistors. Proc. 3rd Europ. Hybrid Microelectronics Conference, Avignon (1981) pp. 19?25
4. G. De Mey; Appl. Phys.6, 189?197 (1975)10.1007/BF00883751 ↗
5. E.N. Economon:Green's Functions in Quantum Physics, 2nd edn., Springer Ser. Solid-State Sci.7 (Springer, Berlin, Heidelberg 1983)
6. J. Shyn, G. Temes, K. Yao: IEEEJ. SC-17, 1070?1076 (1982)
7. A. Angot:Compl�ments de math�matiques (Masson, Paris 1972) pp. 145?146