Low field DC investigation of hot carrier trapping in silicon dioxide films
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OpenAlex topics: Semiconductor materials and devices · ZnO doping and properties · Advancements in Semiconductor Devices and Circuit Design
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References (8)
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6. D.A. Buchanan, M.V. Fischetti, D.J. DiMaria: In [1] pp. 420–428
7. D.R. Young: In The Physics and Chemistry of SiO2 and the Si-SiO2 Interface, ed. by C.R. Helms, B.E. Deal (Plenum, New York 1988) pp. 487–49610.1007/978-1-4899-0774-5_54 ↗
8. C. Svensson: In The Si-SiO2 System, ed. by P. Balk (Elsevier, Amsterdam 1988) Chap. 5, pp. 221–271