A second-order perturbation method for potential calculations in non-homogeneous conducting layers
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Research context
OpenAlex topics: Surface and Thin Film Phenomena · Non-Destructive Testing Techniques · Microwave and Dielectric Measurement Techniques
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References (1)
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1. G.DeMey: Appl. Phys.6, 189–197 (1975)10.1007/BF00883751 ↗