New scattering formula for the analysis of X-ray line broadening by composition profiles
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Abstract
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Research context
OpenAlex topics: X-ray Diffraction in Crystallography · Crystallography and Radiation Phenomena · Radiation Shielding Materials Analysis
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References (11)
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10. T. Wieder: Thesis, Gesamthochschule Kassel, Fed. Rep. Germany (1988)
11. K.E. Wiedemann, J. Unnam: ?TIBAC ? Transformation of an Intensity Band for the Analysis of Composition?, Rept. No. LAR-13356, Computer Software Management and Information Center, University of Georgia (1984)