journal article·1990-05

Sub-gap absorption study of defects in ion-implanted and annealed Si layers

L. Luciani, U. Zammit, M. Marinelli, R. Pizzoferrato

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Silicon and Solar Cell Technologies · Thin-Film Transistor Technologies · Semiconductor materials and interfaces

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References (15)

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