Virtual photon scattering at subwavelength sized tips
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Near-Field Optical Microscopy · Integrated Circuits and Semiconductor Failure Analysis · Semiconductor Quantum Structures and Devices
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (27)
Show source-provided references
1. D.W. Phol:Advances in optical and electronic microscopy, Acad. Press12, 243 (1991)
2. U. Dülrig, D.W. Phol, F. Rohner: Jour. Appl. Phys.59, 3318 (1986)10.1063/1.336848 ↗
3. R.C. Reddick, R.J. Warmack, T.L. Ferrell:39,1767 (1989)10.1103/PhysRevB.39.767 ↗
4. Y. Hori:Near Field Optics, D.W. Pohl, D. Courjon Ed: Kluwer Acad. Pub. NATO ASI series242, 105 (1993)10.1007/978-94-011-1978-8_13 ↗
5. F. de Fornel, J.P. Goudonnet, J.P. Salomon, E. Lesniewska: Proc. SPIE Conf.1139, 77 (1989)10.1117/12.961777 ↗
6. N.F. van Hulst, M.H.P. Moers, O.F.J. Noordman, R.C. Tack, F.B. Segerink, B. Bolger: Appl. Phys.63, 5461 (1993)
7. F. Baïda, D. Courjon, G. Tribillon:Near Field Optics, D.W. Phol, D. Courjon Ed.: Kluwer Acad. Pub. NATO ASI series242, 71 (1993)10.1007/978-94-011-1978-8_9 ↗
8. M. Castagné, Ch. Prioleau, J.P. Fillard: Appl. Opt.34, 703 (1995)10.1364/AO.34.000703 ↗
9. J.P. Fillard, M. Castagné, Ch. Prioleau: Appl. Opt.34, 3737 (1995)10.1364/AO.34.003737 ↗
10. J.P. Fillard, M. Castagné, Ch. Prioleau, M. Benfedda, J. Bonnafé: NFO 3 conf. Brno (1995) Proc. in Ultramicroscopy61, 85 (1995)
11. Near field optics and nanoscopy, J.P. Fillard Ed. Scientific World (Singapore) to appear 1996
12. M. Born, E. Wolf: Principle of Optics, Pergamon Press 6th Ed. (1987)
13. E. Bourillot, F. de Fornel, L. Salomon, P. Adam, J.P. Goudonnet: Jour. Opt. (Paris)23, 57 (1992)10.1088/0150-536X/23/2/004 ↗
14. J.P. Fillard, M. Castagné, P.C. Montgomery, J. Bonnafé, E. Baudry, D. Montaner: Proc. DRIP conf. Valladolid: J. Jimenez Ed.: IOP series135, 109 (1994)
15. D. Courjon, K. Sarrayeddine, M. Spajer: Opt. Com.71, 1–223 (1989)10.1016/0030-4018(89)90297-6 ↗
16. J.M. Vigoureux, D. Courjon: Appl. Opt.31, 163170 (1992)
17. J.M. Vigoureux, C. Girard, D. Courjon: Opt. Lett.14, 191039 (1989)10.1364/OL.14.001039 ↗
18. C. Girard, D. Courjon: Phys. Rev. B42, 9340 (1990)10.1103/PhysRevB.42.9340 ↗
19. C. Girard, X. Bouju: Jour. Opt. Soc. Am. B9, 2 298 (1992)
20. U. Ch. Fischer:Scanning Tunnel Microscopy and related methods, Kluwer Acad. Pub. NATO ASI series184, 495 (1990)
21. S. Kawata, Y. Inouye: Ultramicroscopy57, 313 (1995)10.1016/0304-3991(94)00159-K ↗
22. Y. Inouye, S. Kawata: Opt. Lett.19, 3159 (1994)10.1364/OL.19.000159 ↗
23. J. Mertz, M. Hipp, J. Mlynek, O. Marti: Appl. Phys. Lett.64, 2338 (1994)10.1063/1.111633 ↗
24. H.U. Danzebrink, O. Ohlsson, G. Wilkening: NFO 3 conf. Brno (1995) to appear in Ultramicroscopy
25. H. Raether:Surface Plasmons, Springer Verlag-Tracts in Modern Physics111, (1998)
26. U. Ch. Fischer, D.W. Pohl: Phys. Rev. Lett.62, 458 (1989)10.1103/PhysRevLett.62.458 ↗
27. G. Mie: Ann der Physik IV25, 377 (1908)10.1002/andp.19083300302 ↗