Lattice parameter and alloy fraction determination of Pb x Sn1−x Te films by RHEED double-patterns
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Surface and Thin Film Phenomena · Physics of Superconductivity and Magnetism · Chalcogenide Semiconductor Thin Films
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (9)
Show source-provided references
1. R.F. Bis, R.J. Dixon: J. Appl. Phys.40, 1918 (1969)10.1063/1.1657866 ↗
2. E.G. Bylander: Mat. Sci. Eng.1, 190 (1966)10.1016/0025-5416(66)90021-8 ↗
3. J.R. Lowney, D.A. Cammack: Mat. Res. Bull.9, 1639 (1974)10.1016/0025-5408(74)90155-X ↗
4. G. Vitali: Rev. Sci. Instr.47, 542 (1976)10.1063/1.1134686 ↗
5. C. Corsi, A. D'Amico, G. Petrocco, E. Fainelli, G. Cappuccio, G. Vitali: Thin Solid Films36, 239 (1976)10.1016/0040-6090(76)90449-1 ↗
6. C. Corsi, E. Fainelli, G. Petrocco, G. Vitali, U. Campisano, G. Foti, E. Rimini: Thin Solid Films33, 135 (1976)10.1016/0040-6090(76)90075-4 ↗
7. L. Lassak, K. Hieber: Thin Solid Films17, 105 (1973)10.1016/0040-6090(73)90010-2 ↗
8. S.U. Campisano, G. Foti, E. Rimini, G. Vitali, C. Corsi: InIon Beam Surface Layer Analysis, Vol. 2 ed. by O. Meyer, G. Linker and F. Kappeler (Plenum Press New York 1976) pp. 585–59510.1007/978-1-4615-8879-5_7 ↗
9. N.R. Short: Brit. J. Appl. Phys. D1, 129 (1968)10.1088/0022-3727/1/1/120 ↗