journal article·1975-03

The secondary-electron background problem in electron excited auger electron spectroscopy

J. E. Houston

Applied Physics· Volume 6· Issue 2
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Abstract

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Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Photocathodes and Microchannel Plates · Laser-induced spectroscopy and plasma

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References (8)

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1. P. Staib, J. Kirschner: Appl. Phys.3, 421 (1974)10.1007/BF00885850 ↗
2. J.E. Houston: Surf. Sci.38, 283 (1973). It should be noted in this respect that Refs. [4] and [7] are reversed in the Staib and Kirschner paper10.1016/0039-6028(73)90162-3 ↗
3. For a general discussion see: J.E. Houston: Rev. Sci. Instr.45, 897 (1974) and for an example of an application to Auger electron spectroscopy see: J. E. Houston: Appl. Phys. Letters24, 42 (1974)10.1063/1.1686763 ↗
4. E.N. Sickafus: Rev. Sci. Instr.42, 933 (1971)10.1063/1.1685310 ↗
5. The Auger feature shown in Fig. 1 is virtually identical to the one for oxygen on tantalum given in the second paper of Ref. [3]—10.1063/1.1655002 ↗
6. J.E. Houston: Valence-band structure in the Auger spectrum of aluminum; J. Vac. Sci. Techn. (in press)10.1116/1.568730 ↗
7. K. Goto, K. Ishikawa: J. Appl. Phys.44, 132 (1973)10.1063/1.1661847 ↗
8. J.T. Grant, T.W. Haas, J.E. Houston: Phys. Letters45, 309 (1973)10.1016/0375-9601(73)90092-3 ↗