journal article·1993-09

Formation of amorphous Al1?x Au x films as a consequence of low-temperature Al/Au-interface reactions in a multilayered system

A. Siber, J. Marien, Th. Koch, P. Ziemann

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OpenAlex topics: Copper Interconnects and Reliability · Semiconductor materials and interfaces · Quasicrystal Structures and Properties

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References (14)

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