journal article·1998-03

Self-organized network structure appearing in the B/Si(111)-( < ![IGNORE[$\sqrt{3}$]]× < ![IGNORE[$\sqrt{3}$]])R30° phase formation process studied by scanning tunneling microscopy

K. Miyake, H. Shigekawa

Applied Physics A· Volume 66· Issue S1
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Abstract

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Research context

OpenAlex topics: Surface and Thin Film Phenomena · Electron and X-Ray Spectroscopy Techniques · Semiconductor materials and interfaces

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