journal article·1993-09

Parametric characterization of dielectric dispersion

S. N. Al-Refaie

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Semiconductor materials and devices · Ferroelectric and Piezoelectric Materials · Silicon Nanostructures and Photoluminescence

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References (10)

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2. M.D. Migahed, F.M. Reicha, M. Ishra, M. El-Nimer: J. Mater. Sci: Mater. Electron. 2, 146 (1991)
3. M.B: Reddy, P.V. Reddy: J. Phys. D: Appl. Phys. 24, 975 (1991)10.1088/0022-3727/24/6/025 ↗
4. P.J. Clarke, A.K. Ray, J. Tsibouklis, A.R. Werninck: J. Mater. Sci: Mater. Electron. 28, 18 (1991)
5. S.N. Al-Refaie: Appl. Phys. A 52, 234 (1991)10.1007/BF00324583 ↗
6. S.N. Al-Refaie, H.S.B. Elayyan: J. Mater. Sci. Lett. 11, 988 (1992)10.1007/BF00729902 ↗
7. S.N. Al-Refaie: Appl. Phys. A 55, 213 (1992)10.1007/BF00334226 ↗
8. V.V. Daniel: Dielectric Relaxation (Academic, New York 1967) Chap. 5
9. S.N. Al-Refaie: Appl. Phys. A 51, 419 (1990)10.1007/BF00348383 ↗
10. S.N. Al-Refaie: Appl. Phys. A 48, 575 (1989)10.1007/BF00617860 ↗