journal article·1992-08

The distribution of trapping states at the Al/InP-oxide interface

S. N. Al-Refaie

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Abstract

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Research context

OpenAlex topics: Semiconductor materials and devices · Semiconductor materials and interfaces · Silicon Nanostructures and Photoluminescence

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References (12)

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1. B. Bouchikhi, C. Mechel, G. Valmount, S. Ravelet, B. Lepley: Semicond. Sci. Technol. 1, 143 (1986)10.1088/0268-1242/1/2/009 ↗
2. G. Weimann: Thin Solid Films 56, 173 (1979)10.1016/0040-6090(79)90062-2 ↗
3. S.N. Al-Refaie: Appl. Phys. A 48, 575 (1989)10.1007/BF00617860 ↗
4. S.N. Al-Refaie: Appl. Phys. A 52, 234 (1991)10.1007/BF00324583 ↗
5. S.N. Al-Refaie: Appl. Phys. A 51, 419 (1990)10.1007/BF00348383 ↗
6. K.S. Cole, R.H. Cole: J. Chem. Phys. 9, 341 (1941)10.1063/1.1750906 ↗
7. F.P. Heiman, G. Warfield: IEEE Trans. ED-12, 167 (1965)10.1109/T-ED.1965.15475 ↗
8. S.N. Al-Refaie: Jpn. J. Appl. Phys. 27, 273 (1988)10.1143/JJAP.27.273 ↗
9. S.N. Al-Refaie: Vacuum 42, 883 (1991)10.1016/0042-207X(91)90552-T ↗
10. J.R. Waldrop, S.P. Kowalczyk, R.W. Grant: Appl. Phys. Lett. 42, 454 (1983)10.1063/1.93968 ↗
11. H. Prier: Appl. Phys. Lett. 10, 361 (1967)10.1063/1.1728213 ↗
12. J.A. Cooper, Jr., E.R. Ward, R.J. Schwartz: Solid-State Electron. 15, 1219 (1972)10.1016/0038-1101(72)90042-1 ↗