Sulphur-doped silicon background-limited infrared photodetectors near 77 K
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Advanced Semiconductor Detectors and Materials · Calibration and Measurement Techniques · Thermal Radiation and Cooling Technologies
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (7)
Show source-provided references
1. A.J. Steckl, R.D. Nelson, B.T. French, R.A. Gudmundsen, D. Schechler: Proc. IEEE63, 67 (1975)10.1109/PROC.1975.9708 ↗
2. D.F. Barbe: Proc. IEEE63, 38 (1975)10.1109/PROC.1975.9707 ↗
3. K.Nummedal, J.C.Fraser, S.C.Su, R.Baron, R.M.Finnila: Proc. San Diego Conf. on CCD Applications (1975) pp. 19–30
4. M.Y.Pines, R.Baron: Proc. Intern. Electronic Devices Meeting, Washington (1974) pp. 446–450
5. N.Sclar: In Infrared Phys. (to be published)
6. L.L. Rosier, C.T. Sah: J. App. Phys.42, 4000–4005 (1971)10.1063/1.1659717 ↗
7. D. Long: Infrared Phys.7, 121–128 (1967)10.1016/0020-0891(67)90033-4 ↗