Preparation and characterization of Cu-Cu2O cermet films
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OpenAlex topics: Ion-surface interactions and analysis · Semiconductor materials and devices · Copper-based nanomaterials and applications
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References (10)
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1. Z.H. Meiksin: In Physics of Thin Films, ed. by G. Hass, M.H. Francombe, R.W. Hoffman (Academic, New York 1975) Vol. 8
2. H.R. Zeller, D. Kuse: J. Appl. Phys. 44, 2763 (1973)10.1063/1.1662647 ↗
3. J.I. Gittleman: Appl. Phys. Lett. 28, 370 (1976)10.1063/1.88784 ↗
4. R.W. Tokarsky, J.P. Marton: J. Vac. Sci. Technol. 12, 643 (1975)10.1116/1.568638 ↗
5. G. Mohan Rao, S. Mohan: Vacuum 40, 313 (1990)10.1016/0042-207X(90)90050-9 ↗
6. B. Abeles, Ping Sheng, M.D. Coutts, Y. Arie: In Advances in Physics, ed. by D.H. Martin, Vol. XXIV, 419 (1975)
7. M. Gajdardziska-Josifovska, R.C. Mcphedran, D.R. Mckenzie, R.E. Collins: Appl. Opt. 28, 2744 (1989)10.1364/AO.28.002744 ↗
8. G. Perny, B. Laville Saint Martin, M. Samirant: Compt. Rend. 263, 265 (1966)
9. A. Rizk, S.B. Youssef, S.K. Habib: Vacuum, 38, 93 (1988)10.1016/0042-207X(88)90603-3 ↗
10. G. Mohan Rao, S. Mohan: Vacuum (to be published)